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Analog and Mixed-signal Boundary-scan: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing): 16

by Adam Osseiran

ISBN 13: 9780792386865

Format: Illustrated (176 pages)
Publisher: Springer
Published: 31 Oct 1999

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VLSI-SoC: From Systems to Silicon: IFIP TC10/ WG 10.5 Thirteenth International Conference on Very Large Scale Integration of System on Chip ... in Information and Communication Technology)

by Ricardo Reis, Adam Osseiran, Hans-Joerg Pfleiderer

ISBN 13: 9781441944672

Format: Paperback (356 pages)
Publisher: Springer
Published: 19 Nov 2010

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Analog and Mixed-Signal Boundary-Scan: A Guide To The Ieee 1149.4 Test Standard (Frontiers In Electronic Testing): 16

by Adam Osseiran

ISBN 13: 9781441951151

Format: Paperback (176 pages)
Publisher: Springer
Published: 10 Dec 2010

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